Publishing: Elsevier

Published: 2004

Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: atomic emission (AES), atomic absorption (AAS) and atomic fluorescence (AFS) spectrometry; mass spectrometry (MS) for inorganic analysis covering spark source (SS-MS), inductively coupled plasma (ICP-MS), glow discharge (GD-MS), and secondary ion mass spectrometry (SIMS) and MS of sputtered neutral atoms (SN-MS); laser induced spectrometry for inorganic analysis including laser enhanced ionization (LEIS), laser induced atomic fluorescence (LIF), resonance ionization spectrometry (RIS) and resonance ionization mass spectrometry (RIMS); X-ray spectrometry including X-ray fluorescence spectrometry (XRF) and related techniques, in particular total-reflection X-ray fluorescence spectrometry (TXRF), and synchrotron radiation- excited X-ray spectrometry (SYNFXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii) instrumentation, and (iv) applications can be submitted for publication.

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